アカサカ テツヤ
赤坂 哲也 所属 理工学部 総合理工学科 職種 教授 |
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言語種別 | 英語 |
発行・発表の年月 | 2024/05 |
形態種別 | 学術雑誌 |
査読 | 査読あり |
標題 | Liquid Phase Epitaxy of GaN Films on Sapphire Substrates under an Atmospheric Pressure Nitrogen Ambience |
執筆形態 | 共著 |
掲載誌名 | Japanese Journal of Applied Physics |
掲載区分 | 国外 |
出版社・発行元 | The Japan Society of Applied Physics |
担当区分 | 最終著者,責任著者 |
著者・共著者 | Masataka Katsuumi and Tetsuya Akasaka |
概要 | GaN films were grown on sapphire substrates using liquid phase epitaxy under an atmospheric pressure nitrogen ambience, employing molten Ga and Fe3N as a source mixture. Single-crystal GaN (0001) films were successfully grown on sapphire (0001) substrates within a growth temperature (Tg) range of 750 to 900 oC. When varying the Fe3N concentration in the range of 0.05 to 3 mol%, lower iron nitride resulted in high crystallinity of GaN (0001) films. The incorporation of iron atoms in GaN can negatively impact crystal quality. Parameterizing Tg at a concentration of 0.1 mol% Fe3N showed that a reduction in the peak width of GaN (0002) X-ray rocking curves. However, at 3 mol%, elevating Tg resulted in the degradation of the crystallinity of GaN. This degradation may be attributed to the increased solubility of iron atoms in GaN with increasing Tg. |